A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis - (Statistics) (Hardcover)
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<p/><br></br><p><b> Book Synopsis </b></p></br></br>Das erste Buch, das die leistungsstarken Analyseinstrumente der Röntgendiffraktion und Röntgen-Fluoreszenzspektrometrie sowie auch das Präparieren von Analyseproben behandelt. Jedes Kapitel liefert detaillierte Informationen, Schritt-für-Schritt-Anleitungen und Anregungen, wo man die notwendige Ausrüstung für Probenpräparationen, Standards und Analysen findet. (10/97)<p/><br></br><p><b> From the Back Cover </b></p></br></br>The first hands-on guide to XRD and XRF sampling and specimen preparation <p/> Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. <p/> This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. <p/> With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. <p/> Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials<br> * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more<br> * Features special chapters on specimen preparation equipment and XRF standards<br> * Contains useful bibliography and helpful references.<p/><br></br><p><b> About the Author </b></p></br></br>VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California. <p/> RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania. <p/> DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.
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